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Short Courses > ICP MS/MS fundamentals
Understanding Mechanisms of ICP-MS/MS for Resolving Polyatomic, Isobaric,
and Other Spectral Interferences.
Presenters: Glenn Woods, ICP-MS Applications Specialist, Agilent Technologies LDA UK Ltd.
Naoki Sugiyama, ICP-MS Product Marketing Agilent Technologies International Japan, Ltd.
This short course will cover the fundamentals of ICP-MS/MS (tandem mass spectrometry) and explain the benefits of MS/MS for resolving problematic spectral interferences. Examples of methods that address specific interferences will be used to illustrate the potential for ICPMS/MS in supporting new applications and improving accuracy and reliability of data in established methods.
In the first part of the course, we will introduce the concepts of ICP MS/MS. We will explain the approaches that can be used to resolve spectral interferences with reaction chemistry, using either on-mass or mass-shift measurement. Potential pitfalls of each approach will be presented, along with the methodology used to overcome them. The key hardware and operating parameters that contribute to successful analysis will be described.
In the second part we will use practical examples to explain the different measurement modes available with ICP-MS/MS, illustrating the performance using applications that have proved difficult for conventional quadrupole ICP-MS and, in some cases, high-resolution sector field ICP-MS. Various reaction gases and reaction chemistries will be discussed, and we will introduce the potential for ICP-MS/MS to address new applications not previously possible using ICP-MS.
Topics will include:
- The technology behind ICP-MS/MS, and how it compares to conventional quadrupole ICP-MS
- Insight into the unique measurement modes available to support method development
- Examples where MS/MS methods offer practical benefits for challenging applications
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